Departmental Bulletin Paper 強磁界トランスファーカーブによる薄膜磁気ヘッドの加工損傷評価
Evaluation of thin film head durability against nanoscale scratches using high field transfer curves

田中, 秀明

50 ( 1 )  , pp.1 - 12 , 2016-03-31 , 湘南工科大学
We investigated the durability of giant magnetoresistive (GMR) heads to nanoscale scratches created during the lapping process. Analysis using high-field transfer curves after deliberate scratching with an atomic force microscope (AFM) identified changes in the magnetization of the head and a reduction in pinning strength,which is a magnetic performance indicator. Additionally, finite element method (FEM) analysis suggested that the overall effects on the GMR head following nanoscale scratching increased with scratch depth.

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