会議発表論文 In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector

A. Pikuz, T.  ,  錦野, 将元  ,  河内, 哲哉

pp.109 - 116 , 2018-03
ISSN:0930-8989
内容記述
We present here a new diagnostics based on using LiF crystal detectors that are able to perform measurements an intensity distribution of X-rays beams with diameters ranging from some microns up to some centimeters with high spatial resolution (~1 micron). in situ, 3D visualization of SACLA XFEL focused beam profile along propagation, including propagation inside photoluminescence solid materials, is demonstrated.

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