Journal Article COHERENT X-RAY DIFFRACTION FOR DOMAIN OBSERVATION II

大和田, 謙二  ,  清水, 大輔  ,  水木, 純一郎  ,  藤原, 孝将  ,  永田, 知子  ,  池田, 直  ,  大和, 英弘  ,  安田, 直彦

513 ( 1 )  , pp.16 - 21 , 2018-01
ISSN:0015-0193
Description
The CXD method have been shown to be applicable to the crystal characterization as well as the domain observation. The present CXDtechnique could evaluate the crystal coherence length up to 10 micro-mand the wide variety of samples were chosen in this study. We haveshown how the ideal Bragg reflection deforms as the disorder and thedefects increases and form the speckle patterns, the typical scatteringpatterns of CXD, by changing the samples. Finally we have successfullyobserved the mm/sub-mm domain arrangements in LuFe2O4/(1-x)Pb(Zn1/3Nb2/3)O3-xPbTiO3 (x = 0.09), where it is hard to be observed bythe conventional diffraction techniques.

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