Journal Article Direct evaluation of influence of electron damage on the subcell performance in triple-junction solar cells using photoluminescence decays

M. Tex, David  ,  Nakamura, Tetsuya  ,  Imaizumi, Mitsuru  ,  Ohshima, Takeshi  ,  Kanemitsu, Yoshihiko

7pp.1985-1 - 1985-8 , 2017-05
The analysis of the subcell performance is crucial to understand the device physics and achieve optimized designs of triple junction solar cells which is a main stream of space solar cells now. Radiation-induced damage of inverted grown InGaP/GaAs/InGaAs triple-junction solar cells for various electron fluences are characterized using conventional current-voltage measurements and time-resolved photoluminescence. The conversion efficiencies of the entire device before and after damage are measured with current-voltage curves and compared with the efficiencies predicted from the time-resolved method. Using the time-resolved data, the change in the carrier dynamics in the subcells is discussed.

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