Presentation Simulation study for the motion of secondary electrons in the irradiation of swift heavy ion into materials

森林, 健悟

In the study of irradiation of swift heavy ions into materials, secondary electrons, which are the free electrons produced from incident ion impact ionization, contribute significantly to the structure change of materials. Aiming to estimate this energy transfer without making assumptions, we develop a new simulation model for the motion of secondary electrons and to spread our model, we describe simple functions using ion impact ionization cross sections (σ) for this motion and the electric filed induced from heavy ion irradiation. Further, to validate our model, we compare our simulation results with those of measurements of the secondary electrons. We will also show the energy transfer of the secondary electrons to target using σ.

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