学術雑誌論文 Soft errors in 10-nm-scale magnetic tunnel junctions exposed to high-energy heavy-ion radiation

Kobayashi, Daisuke  ,  Hirose, Kazuyuki  ,  Makino, Takahiro  ,  Onoda, Shinobu  ,  Ohshima, Takeshi  ,  Ikeda, Shoji  ,  Sato, Hideo  ,  Christopher Inocencio Enobio, Eli  ,  Endoh, Tetuo  ,  Ohno, Hideo

56 ( 8 )  , pp.0802B4-1 - 0802B4-10 , 2017-06
内容記述
Soft errors in 10-nm-scale magnetic tunnel junctions exposed to high-energy heavy-ion radiation

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