会議発表用資料 The observation of transient thin film structures during the femto-second laser ablation process by using the soft x-ray laser probe

長谷川, 登  ,  長谷川登  ,  錦野  ,  石野, 雅彦  ,  大西直史  ,  伊藤篤史  ,  南康夫  ,  馬場基芳  ,  Faenov, A.Y.  ,  Inogamov, N.  ,  河内, 哲哉  ,  末元徹

2016-05-24
内容記述
We have improved a soft x-ray laser interferometer synchronized with a Ti:Sapphire laser pulse to observe the single-shot image of the nano-scaled structure dynamics of the laser induced materials. By using this system, we have succeeded in the observation of the thin film structures above the solid (or liquid) surface in the femto-second laser ablation process of metals (Au).
The 15th International Conference on X-Ray Lasers

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