Journal Article C ion and X–ray induced sucrose radicals investigated by CW EPR and 9 GHz EPR imaging

Nakagawa, Kouichi  ,  Hara, Hideyuki  ,  Ken-ichiro, Matsumoto

We investigated stable radical distribution and particle tracks in sucrose irradiated by C ion irradiation with continuous wave (CW) electron paramagnetic resonance (EPR) and 9 GHz EPR imaging. Both EPR results were compared with X–ray irradiation at a similar dose. Radical distribution in sucrose crystals induced by C ion and X–ray irradiation were completely different. The 2D EPR imaging results suggested that radical species were mostly located inside the sucrose crystal. Fewer radicals were found on the surface region of the sucrose crystal. The high radical intensities in relation to the C ion energy deposition are clearly observed at Bragg peak region. No trace of the stable radicals was found after the peak region. The stable radicals of sucrose were distributed as results of recombination of radicals induced by particle interaction. For the first time, the present EPR images showed the stable radical distribution and particle tracks in the crystal in association with particle-sucrose interaction.

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