Departmental Bulletin Paper メゾスコピック物質の巨視的吸着力評価法の開発(学内特別研究および国外研修)

福田, めぐみ  ,  Megumi, Fukuta

Description
The evaluation of total adsorption force of mesoscopic material has not been achieved. Atomic force microscopy (AFM) is most famous as a measurement technique of adsorption force of mesoscopic material. AFM methods have mainly two uses: measuring the adsorption force between the cantilever tip and mesoscopic material, and measuring the lateral force of the cantilever tip as peel force of mesoscopic material on substrate. W e focused on the lateral force measurement because the method has wide contact area of the cantilever tip and mesoscopic material. The method has a problem that occurs, caused by shear force to mesoscopic material by tiny tip. Here we report the development of the wide area tip that caused no damage to the material.
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