The evaluation of total adsorption force of mesoscopic material has not been achieved. Atomic force microscopy (AFM) is most famous as a measurement technique of adsorption force of mesoscopic material. AFM methods have mainly two uses: measuring the adsorption force between the cantilever tip and mesoscopic material, and measuring the lateral force of the cantilever tip as peel force of mesoscopic material on substrate. W e focused on the lateral force measurement because the method has wide contact area of the cantilever tip and mesoscopic material. The method has a problem that occurs, caused by shear force to mesoscopic material by tiny tip. Here we report the development of the wide area tip that caused no damage to the material.