Journal Article Insights on the Body Charging and Noise Generation by Impact Ionization in Fully Depleted SOI MOSFETs

Marquez, Carlos  ,  Rodriguez, Noel  ,  Gamiz, Francisco  ,  Ohata, Akiko  ,  Marquez, Carlos  ,  Rodriguez, Noel  ,  Gamiz, Francisco  ,  大畠, 昭子

64 ( 12 )  , pp.5093 - 5098 , 2017-12 , Institute of Electrical and Electronics Engineers
ISSN:0018-93831557-9646
NCID:AA00667820
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Accepted: 2017-10-11

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