Journal Article Memory reliability of spintronic materials and devices for disaster-resilient computing against radiation-induced bit flips on the ground

Hirose, Kazuyuki  ,  Kobayashi, Daisuke  ,  Ito, Taichi  ,  Endoh, Tetsuo  ,  廣瀬, 和之  ,  小林, 大輔  ,  伊藤, 大智  ,  遠藤, 哲郎

56 ( 8 )  , p.0802A5 , 2017-08 , Japan Society of Applied Physics
ISSN:0021-4922
NCID:AA12295836
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Accepted: 2017-04-10

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