Conference Paper (C-1-06) Characterization of Amorphous Silicon Passivation Layer Deposited by Facing Target Sputtering Using Temperature-Dependent Minority Carrier Lifetime Measurement

白取, 優大  ,  Shiratori, Yuta  ,  中田, 和吉  ,  Nakada, Kazuyoshi  ,  宮島, 晋介  ,  Miyajima, Shinsuke

2017-09

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