Conference Paper Direct measurement of blunt end stacking between DNA layers by atomic force microscopy: For understanding mechanisms underlying self-assembly process of DNA molecules

関根, 泰斗  ,  Sekine, Taito  ,  尾笹, 一成  ,  Ozasa, Kazunari  ,  丹生, 隆  ,  Nyu, Takashi  ,  林, 智広  ,  HAYASHI, Tomohiro

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