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Atomic disorder of Li<sub>0.5</sub>Ni<sub>0.5</sub>O thin films caused by Li doping: estimation from X-ray Debye-Waller factors Atomic disorder of Li<sub>0.5</sub>Ni<sub>0.5</sub>O thin films caused by Li doping: estimation from X-ray Debye-Waller factors |
Yang, Anli , 坂田, 修身 , SAKATA, OSAMI , 山内, 涼輔 , Yamauchi, Ryosuke , Kumara, LOKU SINGGAPPULIGE, Rosantha , Song, Chulho , 勝矢, 良雄 , Katsuya, Yoshio , 松田, 晃史 , Matsuda, Akifumi , 吉本, 護 , YOSHIMOTO, MAMORU
48
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# 6
)
, pp.1896
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1900 , 2015-12 , International Union of Crystallography
ISSN:1600-5767
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