Conference Paper Measurement of the SiO2/SiC interface state density in a wide energy-level range using capacitance transient spectroscopy

長谷川, 淳一  ,  Hasegawa, Junichi  ,  岩崎, 孝之  ,  Iwasaki, Takayuki  ,  小寺, 哲夫  ,  Kodera, Tetsuo  ,  波多野, 睦子  ,  Hatano, Mutsuko

2015-12

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