Conference Paper OCVD法での接合容量の効果:電流成分を含んだモデル式の構築

真辺, 航  ,  原田, 翔平  ,  司馬, 悠地  ,  大村, 一郎  ,  附田, 正則

PE-16p.PE-16-043 , 2016-03 , 社団法人電気学会
Description
We discussed applying the open circuit voltage decay (OCVD) method to measure carrier lifetime of power devices. A deviation of the carrier lifetime was confirmed by TCAD simulation on low level injection conditions. Introducing a transition model of carrier, a high accuracy measurement could be achieved.
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http://ds.lib.kyutech.ac.jp/dspace/bitstream/10228/5740/1/nperc46.pdf

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