Conference Paper OCVD法での接合容量の効果:電流成分を含んだモデル式の構築

真辺, 航  ,  原田, 翔平  ,  司馬, 悠地  ,  大村, 一郎  ,  附田, 正則

We discussed applying the open circuit voltage decay (OCVD) method to measure carrier lifetime of power devices. A deviation of the carrier lifetime was confirmed by TCAD simulation on low level injection conditions. Introducing a transition model of carrier, a high accuracy measurement could be achieved.
電力技術/電力系統技術/半導体電力変換技術合同研究会, 3月8日-9日, 2016年, 九州工業大学 戸畑キャンパス, 福岡県 

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