テクニカルレポート PATSTAT revisited

Tarasconi, Gianluca  ,  Kang, Byeongwoo  ,  姜, 秉祐

5272015-04 , Institute of Developing Economies, JETRO
内容記述
This study provides a comprehensive summary of and guidance for using the EPO Worldwide Patent Statistical Database (PATSTAT), one of the most widely used patent databases for researchers. We highlight the three most important issues that PATSTAT users must consider when performing patent data analyses and suggest ways to deal with those issues. Although PATSTAT is chosen in this study, the issues that we discuss are also applicable to other patent databases.
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http://ir.ide.go.jp/dspace/bitstream/2344/1460/1/ARRIDE_Discussion_No.527_tarasconi.pdf

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