Departmental Bulletin Paper ∞コイル型渦電流センサによる裏側欠損探傷に関する研究

濱中, 峻一

Description
This paper describes the backside defect searching by means of the low frequency excitation to the flat shape of ∞ coil eddy current sensor. Low frequency excitation to the eddy current sensors confronts to an environmental noise problem in the practical field tests. To overcome this difficulty, this paper employs two methodologies. One is an averaged sum and the other is the Fourier transform signal processing methods to reduce the higher frequency noise components. As a result, we have elucidated that the backside defect searching is possible by employing the low frequency excitation to the flat shape of ∞ coil eddy current sensor. Experimental as well as numerical verifications along with intensive three-dimensional finite element method simulations are carried out to confirm our results. Key Words : Eddy current testing, Non-destructive testing, Flat shape of ∞ coil
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http://repo.lib.hosei.ac.jp/bitstream/10114/13004/1/14R3133%e6%bf%b1%e4%b8%ad%e5%b3%bb%e4%b8%80.pdf

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