
Chemically nonequilibrium model of decaying N2 arcs in a model circuit breakerChemically nonequilibrium model of decaying N2 arcs in a model circuit breaker 
"/Sun, Hao/"Sun, Hao ,
"/Tanaka, Yasunori(1000090303263)/"Tanaka, Yasunori ,
"/Rong, Mingzhe/"Rong, Mingzhe ,
"/Uesugi, Yoshihiko(1000090213339)/"Uesugi, Yoshihiko ,
"/Ishijima, Tatsuo(1000000324450)/"Ishijima, Tatsuo
(7368385)
, pp.40

45 , 20151025 , Institute of Electrical and Electronics Engineers Inc.
ISBN:9781467374149
内容記述
Nitrogen gas has been investigated as one of the candidate substitutes for SF6 in a highvoltage circuit breaker (HVCB) and also in a lowvoltage interrupter. In this paper, a chemically nonequilibrium model was established to investigate N2 arc plasmas in the decaying phase during current interruption in a model circuit breaker. Unlike the conventional model assuming local thermodynamic equilibrium, i.e. both chemical equilibrium and thermal equilibrium, in this work a chemically nonequilibrium model was developed for N2 arc plasmas. Thermal nonequilibrium effects were neglected, meaning a onetemperature model was adopted. The developed model took into account 5 species such as N2, N, N2+, N+ and e, and 22 chemical reactions including electron impact ionizations, heavy particles impact dissociations and their backward reactions. Temperature dependent reaction rates were used for all considered reactions. The species composition in N2 arc plasma was calculated by solving the mass conservation equation of each species considering diffusion, convection and reaction effects. Then the influence of the chemically nonequilibrium composition on the arc behavior was calculated by updating the thermodynamic and transport properties at each iterative step. Finally, for the decaying N2 arc plasma under a free recovery phase, the time evolutions were derived in the profiles of the temperature and the number densities for each species. The results in this work were compared with the calculated results based on the chemical equilibrium assumption. © 2015 IEEE.
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