学術雑誌論文 Improvements in fundamental performance of liquid-environment atomic force microscopy with true atomic resolution

Miyata, Kazuki  ,  Miyazawa, Keisuke  ,  Reza Akrami, Seyed Mohammad  ,  Fukuma, Takeshi

54 ( 8 )  , p.08 , 2015-08-01 , 応用物理学会 = Japan Society of Applied Physics
ISSN:0021-4922
NII書誌ID(NCID):AA11906093
内容記述
Recently, there have been significant advancements in liquid-environment atomic force microscopy (AFM) with true atomic resolution. The technical advancements are followed by a rapid expansion of its application area. Examples include subnanometer-scale imaging of biological systems and three-dimensional measurements of water distributions (i.e., hydration structures) and fluctuating surface structures. However, to continue this progress, we should improve the fundamental performance of liquid-environment dynamic-mode AFM. The present AFM technique does not allow real-time imaging of atomic-scale dynamic phenomena at a solid-liquid interface. This has hindered atomic-level understanding of crystal growth and dissolution, catalytic reactions and metal corrosion processes. Improvement in force sensitivity is required not only for such a high-speed imaging but also for various surface property measurements using a high-resolution AFM technique. In this review, we summarize recent works on the improvements in the force sensitivity and operation speed of atomic-resolution dynamic-mode AFM for liquid-environment applications. © 2015 The Japan Society of Applied Physics.
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http://dspace.lib.kanazawa-u.ac.jp/dspace/bitstream/2297/43401/1/SC-PR-FUKUMA-T-08LA03.PDF

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