学術雑誌論文 An offset distribution modification technique of stochastic flash ADC

Jo, Ikkyun  ,  Tani, Sadahiro  ,  Yano, Shinya  ,  Matsuoka, Toshimasa  ,  Asano, Tomohiro  ,  Hirai, Yusaku

13 ( 6 )  , pp.1 - 10 , 2016 , 電子情報通信学会 , The Institute of Electronics, Information and Communication Engineers , デンシ ジョウホウ ツウシン ガッカイ
ISSN:13492543
内容記述
A new non-linearity reduction technique for stochastic flash ADC (SF-ADC) is proposed, focusing on distribution of comparator input-referred offsets. The SF-ADC test chip fabricated in a 130-nm CMOS process demonstrated the proposed technique can improve SNDR. In addition, the digital re-quantization also can improve the linearity more, where quantization level and fractional correction can be optimized using genetic algorithm.
本文を読む

http://ir.library.osaka-u.ac.jp/repo/ouka/all/55419/IEICE Electronics Express_13_6_1.pdf

このアイテムのアクセス数:  回

その他の情報