学術雑誌論文 Fermi-level pinning of bilayer graphene with defects under an external electric field

Kishimoto, Ken  ,  Okada, Susumu

110 ( 1 )  , p.011601 , 2017-01 , American Institute of Physics
ISSN:0003-6951
NII書誌ID(NCID):AA00543431
内容記述
The electronic structure of bilayer graphene, where one of the layers possesses monovacancies, is studied under an external electric field using density functional theory. Our calculations show that Fermi-level pinning occurs in the bilayer graphene with defects under hole doping. However, under electron doping, the Fermi level rapidly increases at the critical gate voltage with an increasingelectron concentration. In addition to the carrier species, the relative arrangement of the gate electrode to the defective graphene layer affects the Fermi energy position with respect to the carrier concentration. Because the distribution of the accumulated carrier depends on the electrode position,the quantum capacitance of bilayer graphene with defects depends on the electrode position.
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