学術雑誌論文 Utilization of Path-Clustering in Efficient Stress-Control Gate Replacement for NBTI Mitigation

MORITA, Shumpei  ,  BIAN, Song  ,  SHINTANI, Michihiro  ,  HIROMOTO, Masayuki  ,  SATO, Takashi

E100.A ( 7 )  , pp.1464 - 1472 , 2017-07-01 , Institute of Electronics, Information and Communications Engineers (IEICE)
ISSN:1745-1337
内容記述
Replacement of highly stressed logic gates with internal node control (INC) logics is known to be an effective way to alleviate timing degradation due to NBTI. We propose a path clustering approach to accelerate finding effective replacement gates. Upon the observation that there exist paths that always become timing critical after aging, critical path candidates are clustered to select representative path in each cluster. With efficient data structure to further reduce timing calculation, INC logic optimization has first became tractable in practical time. Through the experiments using a processor, 171x speedup has been demonstrated while retaining almost the same level of mitigation gain.
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http://repository.kulib.kyoto-u.ac.jp/dspace/bitstream/2433/226311/1/transfun.E100.A.1464.pdf

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