Thesis or Dissertation Variability in BTI-Induced Device Degradation: from Silicon Measurement to SRAM Yield Prediction

Awano, Hiromitsu

2016-03-23 , Kyoto University
Description
新制・課程博士
甲第19862号
情博第613号
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http://repository.kulib.kyoto-u.ac.jp/dspace/bitstream/2433/215689/1/yjohk00613.pdf

http://repository.kulib.kyoto-u.ac.jp/dspace/bitstream/2433/215689/2/djohk00613.pdf

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