学術雑誌論文 Device-Independent Tests of Quantum Measurements

Dall’Arno, Michele  ,  Brandsen, Sarah  ,  Buscemi, Francesco  ,  Vedral, Vlatko

118 ( 25 )  , pp.250501 - 250501 , 2017-06-23 , American Physical Society
ISSN:0031-9007
内容記述
We consider the problem of characterizing the set of input-output correlations that can be generated by an arbitrarily given quantum measurement. Our main result is to provide a closed-form, full characterization of such a set for any qubit measurement, and to discuss its geometrical interpretation. As applications, we further specify our results to the cases of real and complex symmetric, informationally complete measurements and mutually unbiased bases of a qubit, in the presence of isotropic noise. Our results provide the optimal device-independent tests of quantum measurements.
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